Nd:YLF Crystal
Nd:YLF crystals are grown with Czochralski method. The use of high quality starting materials for crystal growth, whole boule interferometry, and precise inspection of scattering particle in crystal using He-Ne laser assures that each crystal will perform well.
Properties
Transparency range: |
180-6700nm |
Peak Stimulated Emission Cross Section |
1.8x1o-19xcm2(E‖C)at 1064nm
1.2x1o-19xcm2(E┴C)at 1053nm |
Spontaneous Fluorescence Lifetime |
485μs for 1% Nd doping |
Scatter Losses |
<0.2%/cm |
Peak Absorption Coefficient(for 1.2% Nd) |
a=10.8cm-1(792.0 nm E‖C)
a=3.59cm-1(797.0 nm E┴C) |
Laser Wavelength |
1047nm(‖c, a-cut crystal)
1053nm(┴c, a or c-cut crystal) |
Chemical Formula |
LiY1.0-xNdxF4 |
Space Group |
141/a |
Nd atoms/m3 |
1.40X1020atoms/cm3 for 1% Nd doping |
Modulus of Elasticity |
85 GPa |
Crystal Structure: |
tetragonal |
Cell Parameters: |
a=5.16Â,c=10.85Â, |
Melting Point: |
819℃ |
Mohs Hardness: |
4~5 |
Density: |
3.99g/cm3 |
Thermal Conductivity |
0.063W/cm K |
Specific Heat |
0.79J/gK |
Thermal conductivity |
8.3x10-6/k‖c
13.3x10-6/k┴c |
The Sellmeier equations (λ in μm) |
no2=1.38757+0.70757λ2/(λ2-0.00931)+0.18849λ2/(λ2-50.99741)
ne2=1.31021+0.84903λ2/(λ2-0.00876)+0.53607λ2/(λ2-134.9566) |
Index of Refraction
Wavelength(nm) |
no |
ne |
262 |
1.485 |
1.511 |
350 |
1.473 |
1.491 |
525 |
1.456 |
1.479 |
1050 |
1.448 |
1.470 |
2065 |
1.442 |
1.464 |
Specifications
Standard Dopant |
1.1±0.1% |
Wavefront Distortion |
<λ/4 per inch @633nm |
Parallelism |
<20 arc seconds |
Perpendicularity |
<5 arc minutes |
chamfer |
0.13±0.07mm@45° |
Surface Quality |
10/5(MIL-PRF-13830B) |
End Coating |
R<0.15%@1047/1053nm |
Surface Flatness |
λ/8@632.8nm |
|
